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Other articles related with "spectroscopic ellipsometry"：
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67801 |
Yunlu Lian(练芸路), He Yu(于贺), Zhiqing Liang(梁志清), Xiang Dong(董翔) |
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Gradient refractive structured NiCr thin film absorber for pyroelectric infrared detectors |
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Chin. Phys. B
2019 Vol.28 (6): 67801-067801
[Abstract]
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[HTML 1 KB]
[PDF 898 KB]
(125)
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47304 |
Dahai Li(李大海), Xiongfei Song(宋雄飞), Linfeng Hu(胡林峰), Ziyi Wang(王子仪), Rongjun Zhang(张荣君), Liangyao Chen(陈良尧), David Wei Zhang(张卫), Peng Zhou(周鹏) |
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Study on electrical defects level in single layer two-dimensional Ta2O5 |
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Chin. Phys. B
2016 Vol.25 (4): 47304-047304
[Abstract]
(773)
[HTML 1 KB]
[PDF 882 KB]
(321)
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30701 |
Gao Xiao-Yong (郜小勇), Chen Chao (陈超), Zhang Sa (张飒) |
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Optical properties of aluminum-doped zinc oxide films deposited by direct-current pulse magnetron reactive sputtering |
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Chin. Phys. B
2014 Vol.23 (3): 30701-030701
[Abstract]
(651)
[HTML 1 KB]
[PDF 276 KB]
(982)
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117801 |
Zhang Ting (张婷), Yin Jiang (殷江), Ding Ling-Hong (丁玲红), Zhang Wei-Feng (张伟风) |
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Optical study of Ba(MnxTi(1-x)O3) thin films by spectroscopic ellipsometry |
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Chin. Phys. B
2013 Vol.22 (11): 117801-117801
[Abstract]
(520)
[HTML 1 KB]
[PDF 440 KB]
(412)
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88101 |
Sheng Cui-Cui (盛翠翠), Cai Yun-Yu (蔡云雨), Dai En-Mei (代恩梅), Liang Chang-Hao (梁长浩 ) |
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Tunable structural color of anodic tantalum oxide films |
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Chin. Phys. B
2012 Vol.21 (8): 88101-088101
[Abstract]
(1766)
[HTML 1 KB]
[PDF 2346 KB]
(3080)
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10701 |
Zhang Ji-Tao(张继涛), Wu Xue-Jian(吴学健), and Li Yan(李岩) |
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Mixed polarization in determining the film thickness of a silicon sphere by spectroscopic ellipsometry |
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Chin. Phys. B
2012 Vol.21 (1): 10701-010701
[Abstract]
(1222)
[HTML 1 KB]
[PDF 663 KB]
(604)
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90701 |
Gao Xiao-Yong(郜小勇), Feng Hong-Liang(冯红亮), Ma Jiao-Min(马姣民), and Zhang Zeng-Yuan(张增院) |
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Spectroscopic ellipsometric study of the optical properties of Ag2O film prepared by direct-current magnetron reactive sputtering |
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Chin. Phys. B
2010 Vol.19 (9): 90701-090701
[Abstract]
(1596)
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[PDF 176 KB]
(2245)
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106803 |
Zhu Zhi-Li(朱志立), Ding Yan-Li(丁艳丽), Wang Zhi-Yong(王志永), Gu Jin-Hua(谷锦华), and Lu Jing-Xiao(卢景霄) |
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Deposition pressure effect on the surface roughness scaling of microcrystalline silicon films |
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Chin. Phys. B
2010 Vol.19 (10): 106803-106803
[Abstract]
(1313)
[HTML 1 KB]
[PDF 2937 KB]
(1863)
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